DualBeam Lab · SEM / FIB Simulator

Microphone off

DualBeam LabSEM / FIB SIMULATOR

Vacuum ready

Image magnification

SEM + FIB · Smaller field = higher magnification.

Field width (µm)

ELECTRON IMAGE01

SEM · 1536×11041 µs · 1× averaging

ION IMAGE02

ION BEAM BLANKEDUnblank to acquire at these settings

ION · 1536×11041 µs · 1× averaging

3D CHAMBER03

Loading the 3D chamber. Your instrument controls remain available.

SPECIMEN CROSS-SECTION04

CONTROL CONSOLE ONLINE

7.00 mmSTAGE TILT0.0 °CHAMBER3.0e-6 mbar

IMAGING & ALIGNMENT

VoltageBeam current

Detector

Chamber detector sideAperture diameter

Focus0.0 µm

Stigmator X0.00

Stigmator Y0.00

Pixel dwell

Frame integrationScan raster

Calculated probe · nominal frame time7.8 nm1.70 s per frame. Scan preview resolution is 384 × 276. Focus and stigmation become clearer at smaller field widths.

Signal gain1.00

Contrast stretch1.00

Gain scales the detected signal. Contrast stretches values around grey level 110/255: darker values get darker and brighter values get brighter.

Interaction range · silicon0.468 µmLower voltage reduces this model’s estimated interaction range.

Ready to explore. Drag the electron image to move the stage.

Specimen protected from ion exposure

Lesson selection · SEM / FIB

One step, one reason.

Think like a microscopist.

Image magnification