DualBeam LabSEM / FIB SIMULATOR
Vacuum ready
Microphone off
INSTRUMENT / 01

Two beams. One specimen.

WORKING DISTANCE7.00 mmSTAGE TILT0.0 °CHAMBER3.0e-6 mbar
ELECTRON IMAGE01
6.0 µm
SEM · 1536×1104 · 1 µs · 1×
ION IMAGE02
6.0 µm
ION · 1536×1104 · 1 µs · 1×
ION BEAM BLANKEDUnblank to acquire an ion image
3D CHAMBER03
SPECIMEN CROSS-SECTION04